 The SALD-7101 is the first in the world to adopt a
375 nm UV semiconductor laser. This provides a
great new tool for research and development in nanotechnology and life sciences.
Cat. No. SZ-347-60710-20 SALD-7101
Features
10 nm Lower Limit of Detection
A previously unreachable 10 nm lower limit of detection is achieved through a combination of a
world-first 375 nm-wavelength UV semiconductor laser light source and a light sensor consisting of a
high-sensitivity light receptors created by the most up-to-date production processes specifically to handle UV lasers.
Measure Concentrations from Several ppm to 20%
Compared to other instruments, SALD-7101 permits measurements across an extremely broad range of concentrations from several ppm to 20%. The particle size of fine particles, particularly nanoparticles, varies with the concentration. The dispersion and coagulation of nanoparticles can be observed while altering the concentration.
1-second Minimum Measurement Time
The standard setting for the measurement time is 10 seconds but can be reduced to a minimum of
1 second. The particle size distribution can be displayed in real-time at 1-second intervals.
This function is permitted by the use of a single light source that requires no switching and the
wide-angle detection method.
SLIT Optical System
Seamless measurement over the entire range using a single measurement principle, single optical system, and single light source. The SLIT optical system continuously captures forward-scattered light at up to 60° on a single detection plane. Accurate particle size distribution measurements are possible across the entire measurement range using a single standard, as the instrument does not incorporate multiple optical systems that create discontinuities in the data.
Software
The WingSALD-7101 for Windows 2000/Xp combines a variety of data processing functions with simple and quick operability. The software is divided into three "wings" (subprograms) to suit different purposes and processing requirements.
| Wing |
Functions |
Data Processing |
| Wing 1 |
Standard Data Processing |
Measurement and hardware control |
| Wing 2 |
Multiple Data Processing |
Batch process and display for up to 12 data items |
| Wing 3 |
Extended Data Processing |
Statistical processing, time-series processing,
and 3D display for up to 200 data items |
Particle size distribution data and light intensity distribution data can be displayed in real time.
This enables the real-time monitoring of changes in the sample and the dispersion state that occur over time. In particular, the real-time display of particle size distribution data is a unique feature of the
SALD-7101. Changes from the 100¼m level to the 10 nm level and changes from the 10 nm level to the 100¼m level can be observed with complete continuity in terms of both time and particle diameter range.
Statistical processing, time-series processing, 3D processing, and overlay graph of particle size distribution data is possible for up to 200 data items.
Specifications
| Measurement principle |
Laser Diffraction Method |
| Measurement range |
10 nm (0.01 µm) to 300 µm |
| Light source |
UV semiconductor laser (375 nm wavelength) |
| Light detector |
Detector elements for UV semiconductor laser
Total 81 elements (76 forward, 1 side, 4 back) |
| Required power supply |
100,115 or 230 VAC as ordered 50 VA |
| Size |
75 x 28 x 45 cm (WxDxH), 45 kg |
*Standard accessories: RS-232C cable (3m), reference sample |
